CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test

ISBN: 1402083629

Category: Technical

Tag: Science/Engineering


Posted on 2008-06-03, updated at 2009-06-30. By anonymous.

Description



Andrei Pavlov, Manoj Sachdev “CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test"
Springer | 2008-06 | ISBN: 1402083629 | 200 pages | PDF | 5 MB

http://rapidshare.com/files/119703001/CMOS.pdf

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