CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Desig...

ISBN: 1402083629

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Posted on 2019-07-05, by voska89.

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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test by Andrei Pavlov, Manoj Sachdev
English | 2008 | ISBN: 1402083629 | 194 Pages | PDF | 8.0 MB




English | 2008 | ISBN: 1402083629 | 194 Pages | PDF | 8.0 MB
The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.

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